Measurement Technology for Micro-Nanometer Devices. Zongmin Ma

Measurement Technology for Micro-Nanometer Devices

Год выпуска: 0

Автор произведения: Zongmin Ma

Серия:

Жанр: Техническая литература

Издательство: John Wiley & Sons Limited

isbn: 9781118717981

Краткое описание:

A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale • Highlights the advanced research work from industry and academia in micro-nano devices test technology • Written at both introductory and advanced levels, provides the fundamentals and theories • Focuses on the measurement techniques for characterizing MEMS/NEMS devices