Modern Characterization of Electromagnetic Systems and its Associated Metrology. Magdalena Salazar-Palma

Modern Characterization of Electromagnetic Systems and its Associated Metrology - Magdalena Salazar-Palma


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       Library of Congress Cataloging‐in‐Publication Data

      Names: Sarkar, Tapan (Tapan K.), editor. | Salazar-Palma, Magdalena, editor. | Zhu, Ming Da, editor. | Chen, Heng, editor.

      Title: Modern characterization of electromagnetic systems and its associated metrology / edited by Tapan K. Sarkar, Magdalena Salazar-Palma, Ming Da Zhu, Heng Chen.

      Description: Hoboken, NJ : Wiley, 2020. | Includes bibliographical references and index.

      Identifiers: LCCN 2020008264 (print) | LCCN 2020008265 (ebook) | ISBN 9781119076469 (hardback) | ISBN 9781119076544 (adobe pdf) | ISBN 9781119076537 (epub)

      Subjects: LCSH: Electromagnetism–Mathematics. | Electromagnetic waves–Measurement.

      Classification: LCC QC760 .M53 2020 (print) | LCC QC760 (ebook) | DDC 537/.12–dc23

      LC record available at https://lccn.loc.gov/2020008264 LC ebook record available at https://lccn.loc.gov/2020008265

      Cover Design: Wiley

      Cover Image: © zf L/Getty Images

      Preface

      The book contains ten chapters. In Chapter 1, the mathematical preliminaries are described. In the mathematical field of numerical analysis, model order reduction is the key to processing measured data. This also enables us to interpolate and extrapolate measured data. The philosophy of model order reduction is outlined in this chapter along with the concepts of total least squares and singular value decomposition.

      In Chapter 2, we present the matrix pencil method (MPM) which is a methodology to approximate a given data set by a sum of complex exponentials. The objective is to interpolate and extrapolate data and also to extract certain parameters so as to compress the data set. First the methodology is presented followed by some application in electromagnetic system characterization. The applications involve using this methodology to deembed device characteristics and obtain accurate and high resolution characterization, enhance network analyzer measurements when not enough physical bandwidth is available for measurements, minimize unwanted reflections in antenna measurements and, when performing system characterization in a non‐anechoic environment, to extract a single set of exponents representing the resonant frequency of an object when data from multiple look angles are given and compute directions of arrival estimation


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