Amorphous Nanomaterials. Lin Guo
The strong ADF signal is often used to image and locate the of interest areas for EELS measurements [42]. A powerful feature of EELS is that the compositional and bonding information can be visualized at high spatial resolution, where the incident beams excite a core electron to empty states above the Fermi level (EFermi). The core-level binding energy that marks the EELS edge onset allows the specific elemental identification, as the shape of the edge reflects the underlying local partial density of states modified by the presence of a core hole [43]. The function of the core hole is to interpret the ground-state local density of states [44]. A good example for EELS analysis is that it provided useful information to study the transistor miniaturization, where the local electronic structure of gate oxide with roughly 5–6 atoms thickness can be shown by the EELS spectrum. These atoms form a thin dielectric layer, which is expected to have very different electrical and optical properties from the desired bulk SiO2 [43]. More importantly, this technique is suitable for mapping the spatial distribution of formal charges at interfaces for 3d transition metal edges, which has been used to analyze Ti-L edge to provide spatial distribution of conduction and their screening lengths in LaTiO3/SrTiO3 multilayers [45].
For a typical system of EELS spectrometer, a field emission electron gun and strong electromagnetic lenses are used to form a small probe. After interacting with the specimen, the inelastic scattering electrons enter a single-prism spectrometer to produce an energy loss spectrum for a probe detecting zone [46]. A narrow slit is then inserted at the spectrum plane to provide obstacle to scattering electrons with higher angles, giving an energy-filtered transmission electron microscope (EFTEM) image on the charge coupled device (CCD) camera. By recording a sequence of EFTEM images, the electron energy loss spectrum imaging data can be read out at each pixel. Meanwhile, the post-column magnetic prism can also produce EFTEM images, with the imaging aberrations that are corrected by quadrupole and sextuple lenses. If the incident electrons have a kinetic energy of several hundred electron volts and are reflected from the surface of the sample afterward, this is called high-resolution electron energy loss spectroscopy (HREELS). By 1986, 0.4 nm resolution composition profiles were demonstrated [47]. For comparison, X-ray absorption spectroscopy (XAS) has a resolution of approximately 30 nm if using synchrotron radiation focused by a zone plate. After 2000, TEM-based energy loss spectroscopy has undergone great development; the oxidation state of an element can be studied by the near-edge fine structure of EELS, such as the Cr within the inorganic compounds with an oxidation states between 2 and 6 [48]. The near-edge fine structure can give useful information on interatomic bonding, which produced a map showing chemical and bonding information. Further study suggested that this technique can also reduce the image noise without sacrificing spatial resolution [49]. Further improvements include the gun monochromators, which are now commercially available, making the accuracy of TEM–EELS resolution close to that of XAS (∼0.1 eV). More attention has been drawn to the low-loss region of the spectrum, which is driven by the demands of the semiconductor industry and nanotechnology initiatives. With a suitable monochromator, the resolution is possible to achieve ∼10 meV to investigate the chemical bonding and phonon modes in nanostructures, even reaching a 30 keV resolution after correction of lens aberrations [50].
To achieve an atomic resolution with EELS, several requirements must be well considered: (i) Using a high-brightness electron source or a spherical aberration corrector to make the incident beam suitable for a small intense probe and (ii) avoiding the degradation in spatial resolution (dechanneling), which is caused by the transfer of the electron probe to the adjacent atomic columns. This can be resolved with multislice simulation software to preserve the intensity of the original atomic column with a convergence semi-angle of 15 mrad and a specimen of thickness less than 50 nm. (iii) The localization in inelastic scattering, which is the major factor for EELS, has been well discussed [51, 52]. This is related to the degree of coherence in inelastic scattering, while the non-locality is considered as the uncertain region with inelastic scattering partially coherent. One solution was to conduct a small convergence angle and a large collection angle, which correspond to the experimental configuration in favor of the local approximation (as shown in Figure 2.3) [53]. This can take advantage of the small convergence angle to regulate the reciprocal area of mixed dynamic because the factor suppresses non-dipole transitions, while the large collection angle is effective in reducing the interference fringes of inelastic electrons. As obtaining the core loss images, the observation of this kind of local inhomogeneity becomes important, especially for layered perovskite manganite, La1.2Sr1.8Mn2O7 [50], because this method opens up a new way to discuss the local structure and material properties, giving a better understanding of phase transition or magnetic domain wall pinning in strongly correlated materials. (iv) The stability of probe position, where the mechanical vibration of the floor from any adjacent disturbance should be reduced, and the specimen drift during the acquisition should be measured under the ADF imaging mode, the collection of semi-angle for EELS was as large as 31 mrad to reduce the extent of delocalization. In terms of the ultimate goal to realize the quantitative chemical analysis of each atomic column, more improvement needs to overcome the dechanneling and delocalization, and the absorption in electron scattering should be evaluated for each atomic column.
One of the most practical applications for EELS is to study the adsorption and reaction of molecules on metal oxide surfaces, and it is also possible to characterize the activation of adsorbed species on defects sites, particularly for O vacancies. For instance, the nature of hydrogen adsorption on TiO2 (110) can be studied by EELS [54]. After exposing the TiO2 (110) surface to atomic hydrogen at high temperatures, the vibration mode of O–H disappears, while no H2O or H2 molecules were found to desorb from the surface, which demonstrates that the H atoms adsorbed on O-bridge diffused into the bulk rather than desorption. These findings have important consequences for chemical processes involving H atoms absorbed on the TiO2 surfaces. Besides, CO oxidation on RuO2 (110) has also been evaluated by EELS, where CO was bonded weakly to Ru sites while undergone either desorption or reaction with neighboring O upon heating [55]. Notably, the EELS data further reveal that oxygen-depleted at the surface after CO2 desorption. This can be restored at the O2 atmosphere and establishes a remarkable surface redox system. This study can help to understand the mechanism of two types of Ru atom sites, where one is twofold coordinated oxygen atoms (O-bridge) and the other is fivefold coordinated Ru atoms. Another discovery was that (0001) of ZnO, with the oxygen-terminated polar surface, can be the most active surface for methanol synthesis [56]. It is expected that EELS can provide more detailed information about the growth, the chemical reactivity, and the electronic structure of metal oxide surfaces. Especially for heterogeneous catalysis, this technique can better elucidate the microscopic reaction mechanisms under industrial conditions, by bridging the material to pressure gap thereby promoting more study in surface science.
Figure 2.3 (a) Crystal structure of layered perovskite manganite La1.2Sr1.8Mn2O7. Yellow–green spheres corresponding to A site (La and Sr), blue spheres to B sites (Mn), and red spheres to oxygen. There are two different crystallographic A sites in the perovskite block (yellow arrow p) and the rock salt layer (white arrow r). (b) ADF image of the specimen observed along the [010] direction. The areas for two-dimensional EELS and drift measurement are shown by rectangles. (c) EELS spectrum acquired from the rectangular area for the two-dimensional EELS. Source: Reproduced with permission from Kimoto et al. [53]. Copyright 2007, Nature Publishing Group.
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