Spectroscopy for Materials Characterization. Группа авторов

Spectroscopy for Materials Characterization - Группа авторов


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physical effect to be taken into account is reflection [1, 4]. When the parallel beam reported in Figure 1.1 impinges perpendicularly on the sample surface, the mismatch of refractive index between the medium (n 1) and the sample (n 2) induces a transmitted and a reflected beam [1, 4]. Introducing the reflectivity r for normal incidence of light:

      (1.11)

      (1.12)

      (1.13)

      and the absorbance estimation is

      (1.14)

      This result shows that, due to the reflection effect, an absorption different from zero is experimentally observed even in the absence of absorbing centers, that is when N = 0. Taking the more accurate multiple reflections effect between the two surfaces with refractive index mismatch between the sample and the medium, it is found that [4]:

      (1.15)

      where p is the reflection factor. When this factor, or the refractive index dependence on the wavelength, is not known, the “parasitic” effect of reflection cannot be estimated. A technical solution is to take the measurement of the same material using two different thicknesses, if possible. In fact, considering two samples of thickness L 1 and L 2, respectively, we obtain:

      (1.16)

      (1.17)

      This way, it is shown that the two measurements enable to find the experimentally relevant features related to the absorbing centers: the cross section and the concentration, or the absorption coefficient.

      It can be observed that the amount of absorbance (or optical density) changes by changing the wavelength, with a profile depending on the specific features of the investigated material. To carry out a meaningful interpretation of the spectrum, taking in due account the spectral profile and the electronic state distribution, the wavelength axis has to be changed into an axis of energy, E (usually reported in electronvolt, eV; 1 eV = 1.602 ⋅ 10−19 J). To achieve this aim, it is useful to refer to the Planck–Einstein relation [9]: E = , where h is the Planck’s constant (6.626 ⋅ 10−34 J⋅s = 4.136 ⋅ 10−15 eV⋅s). To convert the axis from wavelength to energy, one can use the formula:

      and the conversion equation

. This is defined by (wavelength)−1, 1/λ, and, using Eq. (1.18), it is shown that

      (1.21)

      Concluding this paragraph, it is worth mentioning that the absorption phenomenon is one of the basic processes of the radiation–matter interaction and it is extended in a wide range of energy of the electromagnetic spectrum. The underling physical process is related to the specific atomic or molecular species absorbing the energy from the electromagnetic wave [8, 9]. The frequency range of interest for this chapter includes the visible (Vis) radiation and goes from the near infrared (NIR) to the ultraviolet (UV). In particular, the visible range in vacuum extends in frequency from about 3.8⋅1014 to 7.5⋅1014 Hz, in wavelength from 800 to 400 nm, and in energy from 1.6 to 3.1 eV [1].

      1.1.2 Emission: Fluorescence and Phosphorescence

      (1.22)

      due to some internal processes subtracting energy to the


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