integrated circuit
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|
IEEE
|
Institute of Electrical and Electronics Engineers
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IF
|
intermediate frequency
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InFO_PoP
|
integrated fan out package on package
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I/O
|
input/output
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IoT
|
Internet of Things
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ISM
|
industrial, scientific and medical
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ISSCC
|
International Solid‐State Circuits Conference
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JPL
|
jet propulsion laboratory
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LCD
|
liquid crystal display
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LCP
|
liquid crystal polymer
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LGA
|
land grid array
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LHCP
|
left‐hand circular polarization
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LNA
|
low‐noise amplifier
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LP
|
linearly polarized
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LTCC
|
low‐temperature co‐fired ceramic
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MACM
|
multiple amplitude component method
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MAPCM
|
multiple amplitude phase component method
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MCM
|
multi‐chip module
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MEMS
|
micro‐electromechanical systems
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|
MIM
|
metal–insulator–metal
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MIMO
|
multiple input multiple output
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MMIC
|
monolithic microwave integrated circuit
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MMWAC
|
mmWave anechoic chamber
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mmWave
|
millimeter‐wave
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mSAP
|
modified semi‐additive process
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MUF
|
molded underfill
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NF
|
near‐field
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NF
|
noise figure
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NIST
|
National Institute of Standards and Technology
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NRE
|
non‐recurring engineering
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NRW
|
Nicholson–Ross–Weir
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OTA
|
over‐the‐air
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PAE
|
power‐added efficiency
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PAM
|
phase amplitude method
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PBO
|
polybenzoxazoles
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PCB
|
printed circuit board
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PEC
|
perfect electric conductor
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PER
|
packet error rate
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PET
|
polyethylene terephthalate
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pHEMT
|
pseudomorphic high electron mobility transistor
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PI
|
polyimide
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PLA
|
polylactic acid
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PLL
|
phase‐locked loop
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PMC
|
perfect magnetic conductor
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PP
|
polypropylene
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PPM
|
polarization pattern method
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PTH
|
plated‐through‐hole
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|
p.u.l.
|
per unit length
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QFN
|
quad flat non‐leaded
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QFP
|
quad flat package
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R&D
|
research and development
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RAM
|
random‐access memory
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RCC
|
resin‐coated copper
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RCS
|
radar cross‐section
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RDL
|
redistribution layer
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|
RF
|
radio frequency
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RFIC
|
radio frequency integrated circuit
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|
RFID
|
radio‐frequency identification
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RHCP
|
right‐hand circular polarization
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RLCG
|
resistance, inductance, capacitance, and conductance
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RMS
|
root mean square
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RoHS
|
Restriction of Hazardous Substances Directive
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RSM
|
rotating source method
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RX
|
receiver
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SAM
|
scanning acoustic microscopy
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SAP
|
semi‐additive process
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SAR
|
synthetic aperture radar
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|
SEM
|
scanning electron microscopy
|
